A full suite of embedded monitoring IP managed by a PVT controller with standard interfaces, creates a complete subsystem dedicated to maximizing performance, optimizing power, reliability and enabling highly accurate in-chip analytics
Understanding the silicon speed variation at high volume and also across a single die is essential for enabling the implementation of voltage scaling and age monitoring in mission mode.
Tight thermal control of device activity is essential for performance optimization, power efficiency and long term reliability. Mandatory for FinFET devices.
Measure multiple domain supply voltages across the chip to validate and optimize your power distribution network when stressed with mission mode workloads.