In-Chip Sensing
Fabrics

Actionable data and insights

Embedded Monitoring Subsystems

Configurable by application on Planar & FinFET to 3nm & beyond

A full suite of embedded monitoring IP managed by a PVT controller with standard interfaces, creates a complete subsystem dedicated to maximizing performance, optimizing power, reliability and enabling highly accurate in-chip analytics

pvt controller

Process Monitoring

In-die process speed detection

Understanding the silicon speed variation at high volume and also across a single die is essential for enabling the implementation of voltage scaling and age monitoring in mission mode.

process dector

Thermal Sensing

Deeply embedded thermal analysis

Tight thermal control of device activity is essential for performance optimization, power efficiency and long term reliability. Mandatory for FinFET devices.

thermal sensor

Supply Monitoring

Manage and control variable supply voltage

Measure multiple domain supply voltages across the chip to validate and optimize your power distribution network when stressed with mission mode workloads.

voltage monitor

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