Moortec is now part of Synopsys Find out more
3nm embedded sensing Delivering peace of mind for over a decade Find out more
Now available on TSMC N6 process technology In-chip monitoring, telemetry & analytics enablement Find out more
Read the latest 'Talking Sense' Blog Less Haste More Speed - The Importance of Test Engineers Find out more

Deep insights within
silicon chip technologies

Performance optimisation and enhanced reliability

Silicon assessment during manufacture & test
Real-time, deeply embedded chip monitoring
Feature-rich subsystem integration for advanced nodes down to 5nm
Trusted delivery since 2010

Innovative in-chip technologies & platform support

Real intelligence from your device

Scale your Data Center with confidence

Overall optimization and reliability for high volume devices

Increased visibility for high reliability applications

Moortec InDesign

Chip lifecycle monitoring from design start to mission mode

  • Enhance device screening
  • Optimize power & increase Speed Performance
  • Extend reliability
  • Big data telemetry & analytics enablement


Performance optimization for enhanced design enablement


Exhibiting Embedded In-Chip Monitoring Subsystem Solutions

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Increase device reliability with our in-chip sensing solutions

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