Check out this blog article by Mitch Heins on SemiWiki entitled Self-Monitoring SoCs – An Idea Coming of Age which discusses how embedded in-chip monitoring is gaining momentum in advanced node SoC design.

In a former life I was the GM of a business where we built specialized structures used for semiconductor process bring-up, characterization and monitoring. These monitoring structures were placed in wafer scribe-lines and were used to monitor key parameters during wafer processing. The structures provided feedback to automated process control (APC) loops that dynamically tuned the manufacturing equipment to keep the semiconductor process within specific tolerances. 

Later, the industry played with the idea of using algorithms to identify key transistors of a design that could be monitored by APC loops to center the design for the best performing chip. Standard product chip companies routinely did this, but the idea never caught on in the COT / pure play foundry space due to fears that SoC ……

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About Moortec

Established in 2005, Moortec provides compelling embedded subsystem IP solutions for Process, Voltage & Temperature (PVT) monitoring, targeting advanced node CMOS technologies from 40nm down to 7nm. Moortec’s in-chip sensing solutions support the semiconductor design community’s demands for increased device reliability and enhanced performance optimization, enabling schemes such as DVFS, AVS and power management control systems. Moortec provides excellent support for IP application, integration and device test during production. Moortec’s high-performance analog and mixed-signal IP designs are delivered to ASIC and System on Chip (SoC) technologies within the consumer, mobile, automotive, high performance computing and telecommunications sectors. For more information, please visit, follow us on Twitter and LinkedIn.

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