Another interesting article by Ann Steffora Mutschler, executive editor at Semiconductor Engineering entitled “New Power Concerns At 10/7nm”

New Power Concerns At 10/7nm

“Dynamic, thermal, packaging and electromagnetic effects grow, and so do the interactions between all of them.”

Read the full article below:

New Power Concerns At 10/7nm

For more information about Moortec’s embedded in-chip monitoring IP subsystems for today’s technologies including 7nm visit:

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