Moortec exhibit their embedded In-Chip Monitoring Subsystem IP at the 2017 TSMC OIP Ecosystem Forum in Santa Clara
On Wednesday 13th of September Moortec exhibited their embedded In-Chip Monitoring Subsystem IP at the 2017 TSMC OIP Ecosystem Forum on Wednesday 13th September. The event took place at the Santa Clara Convention Center and the team were on hand to chat to delegates about Moortec’s high performance In-Chip Monitoring Subsystem.
Moortec offer a range of ‘off the shelf’ silicon proven monitoring IP on TSMC 40nm LP/ULP, 28nm HPC, HPC+, HPM and 16nm FFC/FF+ processes.
Moortec have also recently announced the availability of their easy to integrate, embedded subsystem on TSMC’s 7nm FinFET (FF) process. Within the subsystem the new 7nm Temperature Sensor is a high precision low power junction temperature sensor that has been developed to be embedded into ASIC designs. It can be used for a number of different applications including Dynamic Frequency and Voltage Scaling (DVFS), device lifetime enhancement, device characterisation and thermal profiling.
In addition, the new 7nm Process Monitor provides the means for advanced node Integrated Circuit (IC) developers to detect the process variation of 7nm core digital MOS devices. The Process Monitor can be used to enable continuous DVFS optimisation systems, monitor manufacturing variability across chip, gate delay measurements, critical path analysis, critical voltage analysis and also monitor silicon ‘ageing’.
The subsystem also includes the sophisticated Process, Voltage and Temperature (PVT) Controller with AMBA APB interfacing, which supports multiple monitor instances, statistics gathering, a production test access port as well as other compelling features.
Along with our offering we can provide expertise on macro placement, production results, support and guidance on how to implement DVFS/AVS optimisation schemes and reliability schemes. As a big growth area for advanced technology design, Moortec are able to help our customers understand more about architecting and implementing such schemes. Being the only PVT dedicated IP vendor, Moortec is now considered a centre-point for such expertise.
Moortec PVT monitoring IP is designed to optimise performance in today’s cutting edge technologies, solving the problems that come about through scaling of devices towards 28nm, FinFET and 7nm. Applications include Datacentre & Enterprise, Automotive, Mobile, IoT, Consumer (DTV) and Telecommunications.
If you are working on advanced node technologies it is highly likely that your SoC will require monitoring to enhance real-time performance optimisation and lifetime reliability. Understanding how the chip has been made (process) as well as understanding its dynamic conditions (voltage supply and junction temperature) has become a critical requirement for advanced node semiconductor design.
Established in 2005, Moortec provide in-chip monitors and sensors, such as embedded Process Monitors (P), Voltage Monitors (V) and Temperature Sensors (T). Moortec’s PVT monitoring IP products enhance the performance and reliability of today’s Integrated Circuit (silicon chip) designs. Having a track record of delivery to tier-1 semiconductor and product companies, Moortec provide a quick and efficient path to market for customer products and innovations.
If you would like further information about Moortec’s in-chip monitoring subsystem please contact Ramsay Allen on +44 1752 875133 or email: firstname.lastname@example.org
For more information please visit www.moortec.com
- Watch the Moortec Webinar – Why Use Embedded In-Chip Monitoring?
- New Moortec White Paper – The Implementation of Embedded PVT Monitoring Subsystems in Today’s Cutting Edge Technologies.
- Moortec Shortlisted for 3 Techworks Awards
- Moortec at the 2017 ICCAD event in Beijing
- New Moortec Webinar – Why use Embedded In-Chip Monitoring?
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