In-Chip Monitoring Subsystem Solutions on 40nm down to 7nm

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ENHANCED CHIP RELIABILITY AND OPTIMISATION

Moortec provide highly accurate, highly featured Process, Voltage & Temperature Monitoring IP.

Support for:

  • AVS & DVFS Optimisation
  • Enhanced Reliability
  • 40nm, 28nm, 16nm & 7nm

WATCH THE EMBEDDED SUBSYSTEM VIDEO

Watch the latest Moortec In-Chip Monitoring Subsystem Solutions video and find out more about our compelling embedded subsystem IP solutions for Process, Voltage & Temperature (PVT) monitoring, targeting advanced node CMOS technologies from 40nm down to 7nm.

Latest from the Blog

11

Dec

Watch the Moortec Webinar – Why Use Embedded In-Chip Monitoring?

You can now watch a recording of last week’s Moortec Webinar entitled “Why Use Embedded In-Chip […]

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04

Dec

New Moortec White Paper – The Implementation of Embedded PVT Monitoring Subsystems in Today’s Cutting Edge Technologies.

This new whitepaper from Moortec takes a comprehensive look at the Implementation of Embedded PVT Monitoring […]

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21

Nov

Moortec Shortlisted for 3 Techworks Awards

Moortec are proud to be finalists at the forthcoming Techworks Awards Ceremony & Gala Dinner which […]

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