Plymouth, UK (30th Sept 2013) - Moortec Semiconductor Limited, provider of
mixed-signal IP and custom chip solutions, believe that on-chip
Process, Voltage and Temperature (PVT) monitoring has become an
important, if not essential, factor to the design and performance optimisation of
small-geometry designs. Moortec, which provides high performance
analogue IP to customers world-wide, produces temperature sensors,
voltage monitors and process detectors for CMOS geometries such as
40-nanometer (nm), 28-nm and below. Using such monitors embedded
within System on Chip (SoC) designs allows for greater dynamic
performance optimisation, as sensing die temperature, detecting
logic speed and monitoring voltage supply levels can be used
intelligently to vary system clock frequencies and the voltage levels
of supply domains. A key aspect is that optimisation can
be applied to each and every device, either during production or
when devices are ‘in-the-field’. Moortec also believes that
strategies adopted by Integrated Circuit (IC) designers over the
coming years will be heavily influenced through the analysis of
data harvested from in-chip monitors during the life time of each

“The greater process variability that is apparent at these
challenging small geometry CMOS technologies is forcing the IC
design community to look at conditions on-chip, not just generally
but also per device and within regions of a device,” said Stephen
Crosher, Managing Director of Moortec Semiconductor. “The industry
faces the challenge posed by demand for increasingly integrated,
increasingly functional, giga-scale ICs for applications such as
personal mobile technology and multi-core server configurations,
whilst trying to improve battery life and maintaining good performance,”
Crosher continued to say. “At low-geometry nodes, track and via
resistances are dramatically increasing, core supply headroom is
diminishing and the power consumption per unit area of silicon is
increasing, whether that be through static leakage current or
dynamic current consumption. Our easily-to-integrate PVT
monitoring solutions are well placed to enable Dynamic Voltage and
Frequency Scaling (DVFS) optimisation schemes to be used within
the designs.”

Moortec plan to continue extending their IP range within
the embedded monitoring space by providing PVT modules, supply
glitch detectors and DVFS sub-systems, making their technologies available on 28-nm and sub-28-nm process nodes.

See for more information on the METS IP range.

Embedded PVT Monitoring 40LP 40G 28HPM 20nm

About Moortec Semiconductor

Moortec Semiconductor, established in 2005, provide high quality analog and mixed-signal IP blocks as well as Custom Chip solutions world-wide for a variety of applications. The UK based design group also provide Platforms for IC test and evaluation. Having a track record of delivery to tier-1 semiconductor and product companies, Moortec provide a quick and efficient path to market for customer products and innovations. For information please visit

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