Process Monitoring & Detection
The process variability of advanced CMOS technologies has become a significant factor to the speed and power performance of SoC devices. The Moortec Process Detector will allow an IC to self-determine its own manufactured process characteristics, providing information for system optimisation on a PER DIE basis.
- Detect silicon speed type (FAST/SLOW/TYP)
- System performance optimisation
- Age monitoring
- Critical voltage and timing analysis
- Available on 40nm, 28nm, 16nm, 12nm & 7nm