in the series of webinars from Moortec looks at the use of embedded monitoring
for bridging the tangible gap between expectations around FinFET device
performance and that actually seen in silicon.
will provide expertise on how to effectively implement monitoring
architectures, enabling the analysis of dynamic conditions on chip for DVFS and
AVS schemes that will in turn enhance device power and speed performance. The
presentation, aimed at engineers working on FinFET technologies, will also
highlight he challenges posed by process variability and how those challenges
relate to the stability of complex SoC designs.
Moortec provide a complete PVT Monitoring Subsystem
IP solutions on 40nm, 28nm, FinFET and 7nm. As advanced technology design is
posing new challenges to the IC design community, Moortec are able to help our
customers understand more about the dynamic and static conditions on chip in
order to optimize device performance and increase reliability. Being the only
PVT dedicated IP vendor, Moortec is now considered a centre-point for such
registering, you will receive a confirmation email containing information about
joining the webinar.
Established in 2005, Moortec provide
in-chip monitors and sensors, such as embedded Process Monitors (P), Voltage
Monitors (V) and Temperature Sensors (T). Moortec’s PVT monitoring IP products
enhance the performance and reliability of today’s Integrated Circuit (silicon
chip) designs. Having a track record of delivery to tier-1 semiconductor and
product companies, Moortec provide a quick and efficient path to market for
customer products and innovations.
Please contact Ramsay Allen on +44
1752 875133 or email: email@example.com
information please visit www.moortec.com