Moortec Semiconductor will be exhibiting at the TSMC
2017 Israel Technology Workshop on Wednesday 28th June. The event is
taking place at the Dan Accadia Hotel, Herzliya so why not come and meet us at
our booth and discuss in person how your advanced node System on Chip (SoC)
programme can benefit from Moortec’s high performance In-Chip Sensors.

Moortec provide market-leading embedded monitoring
IP subsystems for today’s technologies and specialise in high accuracy, highly
featured embedded Process, Voltage and Temperature (PVT) sensors. Moortec’s IP
enables SoC designs to be performance optimised and monitored on a per die
basis and offers support for AVS/DVFS.

If you are working on advanced node technologies it
is highly likely that your SoC will require monitoring to enhance real-time
performance optimisation and lifetime reliability. Understanding how the chip
has been made (process) as well as understanding its dynamic conditions
(voltage supply and junction temperature) has become a critical requirement for
advanced node semiconductor design. 

Moortec offers a range of ‘off the shelf’ monitoring
IP on TSMC 40nm, 28nm, 16nm and have recently announced the availability of
their design kit on TSMC’s 7nm process.

Moortec are also
the current holders of the TSMC Open Innovation Platform Partner of the Year
Award for the New IP category. 

About Moortec

Established in 2005 Moortec provides compelling embedded subsystem
IP solutions for Process, Voltage & Temperature (PVT) monitoring, targeting
advanced node CMOS technologies from 40nm down to 7nm. Moortec’s in-chip
sensing solutions support the semiconductor design community’s demands for
increased device reliability and enhanced performance optimization, enabling
schemes such as DVFS, AVS and power management control systems. Moortec
provides excellent support for IP application, integration and device test
during production.

you would like to arrange a meeting at the event please contact Ramsay Allen on
+44 1752 875133 or email:

For more information please

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