Moortec Semiconductor will be exhibiting at DAC 2017
from the 19th – 22nd June in Austin, Texas. DAC (Design Automation Conference) is
taking place at the at the Austin Convention Center so why not come and meet us
at booth #2014 and discuss in person how your advanced node System on Chip
(SoC) programme can benefit from Moortec’s high performance In-Chip Sensors.

DAC 2017

The Design Automation Conference (DAC) is recognized
as the premier conference for design and automation of electronic systems.  DAC offers outstanding training, education,
exhibits and superb networking opportunities for designers, researchers, tool
developers and vendors.

Moortec provide market-leading embedded monitoring
IP subsystems for today’s technologies and specialise in high accuracy, highly
featured embedded Process, Voltage and Temperature (PVT) sensors. Moortec’s IP
enables SoC designs to be performance optimised and monitored on a per die
basis and offers support for AVS/DVFS.

If you are working on advanced node technologies it
is highly likely that your SoC will require monitoring to enhance real-time
performance optimisation and lifetime reliability. Understanding how the chip
has been made (process) as well as understanding its dynamic conditions
(voltage supply and junction temperature) has become a critical requirement for
advanced node semiconductor design.

Moortec offers a range of ‘off the shelf’ monitoring
IP on TSMC 40nm, 28nm, 16nm and have recently announced the availability of
their design kit on TSMC’s 7nm process.

About Moortec 

in 2005 Moortec provides compelling embedded subsystem IP solutions for
Process, Voltage & Temperature (PVT) monitoring, targeting advanced node
CMOS technologies from 40nm down to 7nm. Moortec’s in-chip sensing solutions
support the semiconductor design community’s demands for increased device reliability
and enhanced performance optimization, enabling schemes such as DVFS, AVS and
power management control systems. Moortec provides excellent support for IP
application, integration and device test during production.

If you would like to arrange a meeting at the event please
contact Ramsay Allen on +44 1752 875133 or email:

For more information please

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