Plymouth, UK (11th Nov 2013) - Moortec Semiconductor Limited, provider of
analog and mixed-signal IP solutions, announces its range of
high accuracy on-chip temperature sensors for advanced CMOS technologies. This latest range extends Moortec’s position as a leading provider of embedded thermal sensors to
semiconductor customers worldwide. With an uncalibrated accuracy
of +/-3C and a calibrated accuracy of +/-1C, across the
temperature range of -40C to 125C, the new range also offers a
resolution of 0.06C. The new IP range will allow for the
performance of individual Integrated Circuit (IC) designs to be
monitored and enhanced dynamically to a higher accuracy.
Therefore, helping large scale System on Chip (SoC) designs to better manage the internal heating
issues seen on advanced node semiconductor devices due to the
higher gate densities, hence higher power densities, that can now be manufactured.

Applications for the sensor include performance
optimisation schemes such as Dynamic Voltage and Frequency Scaling
(DVFS), thermal monitoring to create alarm conditions and also
device security against hacking. Another application is the
monitoring of on-chip junction temperature, which with the higher
accuracy now offered by Moortec, will allow for improved monitoring during the High Temperature
Operating Life (HTOL) test phase, often required for the
qualification and characterisation of silicon devices. Although
the sensor IP is predominantly analog in design, the digital interfacing
and standard CMOS process option compatibility make it easy to
integrate within any digital implementation flow. Optional extra
digital interfaces are provided with Moortec’s IP range, such as
AMBA APB, I2C, SPI and iJTAG to help customers access the
sensors via their microprocessor cores, access the sensors from
off-chip as part of a power management strategy or provide sensor access during test.

“Moortec believe there is now a critical need for reliable on-chip
monitoring, especially thermal monitoring, for semiconductor
geometries of 28-nanometer (nm), 16nm and 14nm,” said Stephen Crosher, Managing
Director of Moortec Semiconductor. “As transistor geometries
shrink and both gate and power densities per unit area increase,
designers are having to deal with the thermal effects of overheating and poor system performance, hence they are seeking ways in which their designs can
be optimised dynamically,” Crosher continued to add. “Our enhanced
accuracy temperature sensor range, available on TSMC28LP and
TSMC28HPM technology nodes in Q4 2013, enables temperature
dependant clock-throttling schemes to be implemented on a per
device basis, allowing for individual device performance
optimisation. Thermal issues are here to stay and where devices
using 28nm planar CMOS technologies suffer from high leakage
currents which contributes to issues such as thermal runaway, we are also
seeing FinFET and FDSOI technologies exhibit their
own problems due to the increased logic densities, and hence power
densities, that can now be achieved.”

Moortec, also offer on-chip Voltage Monitoring IP for both
steady state supply measurements as well as glitch detection to
customers world-wide. To provide the complete on-chip PVT monitoring
solution, Moortec are currently developing their Process Detector
IP for delivery in Q1 2014. With each block, optionally provided
with extended digital interfacing, their next step is to extend
their range to include integrated PVT die-monitoring modules, DVFS
sub-systems and make available their IP product range on leading edge FinFET technologies.

See for more information on Moortec’s Embedded PVT Monitoring solutions.

Embedded PVT Monitoring 40LP 40G 28HPM 20nm

About Moortec Semiconductor

Moortec Semiconductor, established in 2005, provide high quality analog and mixed-signal IP blocks as well as Custom Chip solutions world-wide for a variety of applications. Having a track record of delivery to tier-1 semiconductor and product companies, Moortec provide a quick and efficient path to market for customer products and innovations. For information please visit

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