Check out the latest article by Ann Steffora Mutschler, executive editor at Semiconductor Engineering entitled “How Reliable Are FinFETs?”

How Reliable Are FinFETS?

“Chipmakers wrestle with EOS, ESD and other power-related issues as leading-edge chips are incorporated into industrial and automotive applications.”

Read the full article by clicking on the image below:

Fig. 1: Result of electrical overstress in laptop IC, where overheating has melted the plastic casing. Source: Wikipedia

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