In-chip Process, Voltage and Temperature (PVT) monitoring is here now and it is here to stay. The costs of advanced node technologies are continuing to increase and we are already starting to see a fragmentation, with the really advanced nodes becoming more niche for those devices which really need the performance. For those nodes, optimisation will be part of the architecture to ensure the cost of those expensive technologies is minimised.
As the rest of the industry moves down to smaller nodes, they will look to differentiate their products from their competitor and good die optimisation will play a part in that.
Since 2010 Moortec have specialised in the development and delivery of PVT sensors on these lower nodes such as 28nm and FinFET. Now more than ever, understanding how the chip has been made (process) as well as understanding it’s dynamic conditions (voltage supply and junction temperature) has become a critical requirement.
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