Next generation optimisation and analytics for your advanced node projects will provide design teams with compelling device and system level insights. Such solutions supported by Moortec’s high accuracy PVT subsystems, providing real time in-chip information, will enable an enhanced appreciation of chip manufacture and the mission-mode device conditions. Such analysis allows for increases in product performance and reliability on new levels, allowing for products to be continually assessed at all stages of the product life cycle.
Cloud-based solutions will utilise existing process, voltage and temperature (PVT) monitoring subsystem data to deliver outstanding remote product optimisation and deep in-field product health reporting. A complete optimization and analytics solution allows technology innovators to attain a new level product assurance, catering for application areas such as Datacentre, IoT, Consumer and Automotive.
Moortec believe that by harnessing previously unobtainable or unused chip data, designers can start to push the limits of device reliability, failure prediction and product-level performance optimization. This in turn will lead to improved user experiences within today’s technological innovations, whilst also bringing the industry one step closer to a world of defect-free products.