Exploring Moortec’s In-Chip Monitoring Subsystem
What allows Moortec’s In-Chip Monitoring Subsystem to optimise the performance and reliability of advanced node SoC’s?
Within the Moortec embedded In-chip monitoring subsystem the Process Monitor provides the means for advanced node Integrated Circuit (IC) developers to detect the process variation of core digital MOS devices.
The Process Monitor can also be used to enable continuous Dynamic Voltage and Frequency Scaling (DVFS) optimisation systems, monitor process variability across chip, gate delay measurements, critical path analysis, critical voltage analysis and also monitor the phenomenon of silicon ageing.
The subsystem also includes a Voltage Monitor which is a low power self-contained IP block specially designed to monitor multiple voltage levels within the core logic voltage domains, also providing accurate IR drop analysis.
The measurement range is customized to suit each technology. The monitor IP can also monitor analogue (IO) supply domains and is well-suited to monitoring supply droops, perturbations and supporting Adaptive Voltage Scaling (AVS) schemes.
To complete the system there is a high precision low power junction Temperature Sensor which has been developed to be embedded into SoC designs. It can be used for a number of different applications including DVFS, device lifetime enhancement, device characterisation and thermal profiling.
The package also includes a sophisticated PVT Controller with AMBA APB interfacing, which supports multiple monitor instances, statistics gathering, a production test access port as well as other compelling features.
Embedded PVT Subsystem Architecture
- Support for custom delay chain structures
- Accurately measures core & IO supply domain voltages
- Measurement of supply ranges up to 1.8V
- High accuracy (temperature sensor accuracy +/-3C uncalibrated, +/-1C calibrated)
- High testability for volume production and reliable operation
- PVT Controller supports multiple monitor instances
Applications include Power (DVFS/AVS) Optimisation, delay loop speed characterisation, critical path analysis, critical voltage analysis and age monitoring.
The Digital interface provides simplified integration with no shielded analogue signals to route and easily addressable sensor instances.
Established in 2005 Moortec provides compelling embedded sub-system IP solutions for Process, Voltage & Temperature (PVT) monitoring, targeting advanced node CMOS technologies from 40nm down to 7nm. Moortec’s in-chip sensing solutions support the semiconductor design community’s demands for increased device reliability and enhanced performance optimization, enabling schemes such as DVFS, AVS and power management control systems. Moortec also provides excellent support for IP application, integration and device test during production.
- Exploring Moortec’s In-Chip Monitoring Subsystem
- In-Chip Performance Optimisation – Things to Consider when choosing a PVT Subsystem
- Moortec support the University of Southampton ELEC6200 Group Design Project Presentation Day
- Moortec IP Product Focus – Embedded Process Monitors
- The importance of embedded in-chip monitoring in advanced node CMOS technology
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