Knowledge, Expertise & Peace of Mind
When it comes to something as critical as in-chip monitoring, choosing the right IP vendor can really give you the peace of mind you are looking for. It’s a situation where you are going to have to trust the knowledge and expertise of a third party provider and this can be daunting.
Third party IP has always been an option for Semiconductor companies and the challenge for IP Vendors like Moortec has been to build long term relationships based on not only an excellent product but outstanding service, support and results. This in turn builds trust, an essential ingredient when so much is at stake.
In-chip sensing solutions support the semiconductor design community’s demands for increased device reliability and enhanced performance optimization, enabling schemes such as DVFS, AVS and power management control systems.
IC developers face challenges associated with the increased gate density of advanced CMOS technologies. These challenges include overheating, greater in-chip process variability and unreliable voltage supplies.
A good in-chip monitoring subsystem provides the solutions to meet these challenges with high accuracy, highly featured process monitors, voltage monitors and temperatures sensors. Applications include consumer, mobile, automotive, high performance computing and telecommunications.
There are a number of reasons why in-chip monitoring is now more relevant than ever especially on the advanced nodes such as 40nm, 28nm, 16nm, 12nm & 7nm.
With advances in CMOS technology and the scaling of transistor channel lengths to nanometer (nm) dimensions, the density of digital circuits per unit area of silicon has increased as has the process variability of devices manufactured.
The increase in digital logic (or gate) density, which equates to an increase in power density, is a major contributor to the heating of semiconductor devices manufactured on advanced node CMOS technologies. In-chip temperature monitoring is used for performance optimisation, an example being Dynamic Voltage and Frequency Scaling (DVFS) where, depending on the thermal conditions, system clocks and voltage supplies can be varied to optimise either the speed of logical operations or power consumed by the device.
Process induced variations in circuit delays have begun to significantly adversely affect chip performance and power consumption. A statistical analysis of each device would show a process variability, or spread, that when compared to historical CMOS technologies is wider (worse) for advanced technology nodes. To address this, manufacturers have to design their Systems-on-Chip (SoC) to over-compensate for unwanted variability arising from manufacturing processes.
Increased logic gate density, increased track and via impedances and process variability has led to significant voltage (IR) drops across advanced node devices. Together with an increasingly noisy environment, the need to monitor core supplies in-chip has become desirable to ensure that operating conditions are acceptable to the complex systems in today’s devices.
Moortec’s PVT monitoring subsystem IP is designed to optimise performance in today’s cutting-edge technologies, solving the problems that come about through scaling of devices. Applications include Datacentre & Enterprise, Automotive, Mobile, IoT, Consumer and Telecommunications.
In-chip monitoring has become a vital factor in the design and performance optimisation of small-geometry designs. Since 2010 Moortec have brought to market a highly featured embedded PVT sensing fabric for or use in-chip within advanced node CMOS technologies from 40nm down to 7nm.
With our wealth of experience in the field of PVT monitoring you can rely on Moortec’s knowledge and expertise to give you peace of mind when choosing your IP vendor.
About Moortec Semiconductor
Established in 2005 Moortec provides compelling embedded sub-system IP solutions for Process, Voltage & Temperature (PVT) monitoring, targeting advanced node CMOS technologies from 40nm down to 7nm. Moortec’s in-chip sensing solutions support the semiconductor design community’s demands for increased device reliability and enhanced performance optimization, enabling schemes such as DVFS, AVS and power management control systems. Moortec also provides excellent support for IP application, integration and device test during production.
- Moortec support the University of Southampton ELEC6200 Group Design Project Presentation Day
- Moortec IP Product Focus – Embedded Process Monitors
- The importance of embedded in-chip monitoring in advanced node CMOS technology
- Canaan-Creative employs Moortec’s Temperature Sensor in their new ASIC aimed at HPC IC
- Moortec Webinar – The Importance of Embedded Monitoring of Process & Voltage in SoCs (New Dates)
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